Co-support for xfd packaging

ABSTRACT

A microelectronic package has a dielectric element with first and second parallel apertures. A first microelectronic element has contacts overlying the first aperture, and a second microelectronic element has contacts overlying the second aperture. The second microelectronic element can overlie a rear face of the first microelectronic element and the same surface of the dielectric element as the first microelectronic element. First terminals on a second surface of the dielectric element between said first and second apertures can be configured to carry all data signals for read and write access to memory locations within the first and second microelectronic elements.

CROSS-REFERENCE TO RELATED APPLICATION

The present application is a continuation of U.S. patent applicationSer. No. 14/063,119, filed Oct. 25, 2013, the disclosure of which isincorporated herein by reference.

BACKGROUND OF THE INVENTION

The subject matter of the present application relates to microelectronicpackages and assemblies incorporating microelectronic packages.

Semiconductor chips are commonly provided as individual, prepackagedunits. A standard chip has a flat, rectangular body with a large frontface having contacts connected to the internal circuitry of the chip.Each individual chip typically is contained in a package having externalterminals connected to the contacts of the chip. In turn, the terminals,i.e., the external connection points of the package, are configured toelectrically connect to a circuit panel, such as a printed circuitboard. In many conventional designs, the chip package occupies an areaof the circuit panel considerably larger than the area of the chipitself. As used in this disclosure with reference to a flat chip havinga front face, the “area of the chip” should be understood as referringto the area of the front face.

Size is a significant consideration in any physical arrangement ofchips. The demand for more compact physical arrangements of chips hasbecome even more intense with the rapid progress of portable electronicdevices. Merely by way of example, devices commonly referred to as“smart phones” integrate the functions of a cellular telephone withpowerful data processors, memory and ancillary devices such as globalpositioning system receivers, electronic cameras, and local area networkconnections along with high-resolution displays and associated imageprocessing chips. Such devices can provide capabilities such as fullinternet connectivity, entertainment including full-resolution video,navigation, electronic banking and more, all in a pocket-size device.Complex portable devices require packing numerous chips into a smallspace. Moreover, some of the chips have many input and outputconnections, commonly referred to as “I/Os.” These I/Os must beinterconnected with the I/Os of other chips. The components which formthe interconnections should not greatly increase the size of theassembly. Similar needs arise in other applications as, for example, indata servers such as those used in internet search engines whereincreased performance and size reduction are needed.

Semiconductor chips containing memory storage arrays, particularlydynamic random access memory chips (DRAMs) and flash memory chips arecommonly packaged in single- or multiple-chip packages and assemblies.Each package has many electrical connections for carrying signals, powerand ground between terminals and the chips therein. The electricalconnections can include different kinds of conductors such as horizontalconductors, e.g., traces, beam leads, etc., which extend in a horizontaldirection relative to a contact-bearing surface of a chip, verticalconductors such as vias, which extend in a vertical direction relativeto the surface of the chip, and wire bonds which extend in bothhorizontal and vertical directions relative to the surface of the chip.

Conventional microelectronic packages can incorporate a microelectronicelement which is configured to predominantly provide memory storagearray function, i.e., a microelectronic element that embodies a greaternumber of active devices to provide memory storage array function thanany other function. The microelectronic element may be or include a DRAMchip, or a stacked electrically interconnected assembly of suchsemiconductor chips. Typically, all of the terminals of such package areplaced in sets of columns adjacent to one or more peripheral edges of apackage substrate to which the microelectronic element is mounted.[Change to “112”—later—to match text] For example, in one conventionalmicroelectronic package 12 seen in FIG. 1, three columns 14 of terminalscan be disposed adjacent a first peripheral edge 16 of the packagesubstrate 20 and three other columns 18 of terminals can be disposedadjacent a second peripheral edge 22 of the package substrate 20. Acentral region 24 of the package substrate 20 in the conventionalpackage does not have any columns of terminals. FIG. 1 further shows asemiconductor chip 11 within the package having element contacts 26 on aface 28 thereof which are electrically interconnected with the columns14, 18 of terminals of the package 12 through wire bonds 30 extendingthrough an aperture, e.g., bond window, in the central region 24 ofpackage substrate 20. In some cases, an adhesive layer 32 may bedisposed between the face 28 of the microelectronic element 11 and thesubstrate 20 to reinforce the mechanical connection between themicroelectronic element and the substrate, with the wire bonds extendingthrough an opening in the adhesive layer 32.

Conventional circuit panels or other microelectronic components aretypically configured to be coupled to a microelectronic package havingone or more first type microelectronic elements therein. Such circuitpanels or other microelectronic components typically cannot be coupledto a microelectronic package having one or more microelectronic elementstherein that are of a different or second type.

In light of the foregoing, certain improvements in the design of circuitpanels or other microelectronic components can be made in order toimprove the functional flexibility or electrical performance thereof,particularly in circuit panels or other microelectronic components towhich packages can be mounted and electrically interconnected with oneanother.

BRIEF SUMMARY OF THE INVENTION

An aspect of the invention provides microelectronic package. The packagecan have a dielectric element having first and second oppositely facingsurfaces, and having first and second spaced apart apertures eachextending between the first and second surfaces. A first microelectronicelement may have a front face facing the first surface, a rear facefacing away from the first surface and an edge extending between thefront and rear faces, the first microelectronic element having contactsexposed at the front face. A second microelectronic element may have afront face partially overlying the rear face of the firstmicroelectronic element and facing the first surface, the secondmicroelectronic element having contacts disposed in a central region ofits front face, the contacts disposed beyond the edge of the firstmicroelectronic element. The dielectric element may have terminals atthe second surface, the contacts of the first microelectronic elementoverlying the first aperture and electrically coupled with theterminals, and the contacts of the second microelectronic elementoverlying the second aperture and electrically coupled with theterminals. The terminals may include a plurality of first terminalsbetween the first and second apertures configured to carry all datasignals for read and write access to random access addressable memorylocations of memory storage arrays within the first and secondmicroelectronic elements.

In accordance with one or more examples, the first and secondmicroelectronic elements can be of type DDRx.

In accordance with one or more examples, the dielectric element may havefirst and second parallel edges extending between the first and secondsurfaces, a first region of the second surface disposed between thefirst aperture and the first edge, a second region of the second surfacebeing disposed between the second aperture and the second edge, whereinthe terminals include second terminals including at least some secondterminals having address information signal assignments for specifyingeach individual addressable memory location within the memory storagearrays, wherein all of the second terminals are disposed at locationswithin at least one of the first and second regions.

In accordance with one or more examples, the second terminals can bedisposed at locations within each of the first and second regions,wherein the signal assignments of the at least some second terminals inthe first region are symmetric about a theoretical axis extendingparallel to the first and second edges of the dielectric element withthe signal assignments of the at least some second terminals in thesecond region.

In accordance with one or more examples, the second terminals in each ofthe first and second regions may include at least some second terminalshaving command information signal assignments, and the signalassignments of the at least some second terminals having commandinformation signal assignments in the first region are symmetric aboutthe theoretical axis with the signal assignments of the at least somesecond terminals having command information signal assignments in thesecond region.

In accordance with one or more examples, the second terminals in thefirst region can be coupled with the contacts of the firstmicroelectronic element and are not coupled with the contacts of thesecond microelectronic element, and the second terminals in the secondregion are coupled with the contacts of the second microelectronicelement and are not coupled with the contacts of the firstmicroelectronic element.

In accordance with one or more examples, the first and secondmicroelectronic elements can be configured to receive the data signalssimultaneously at the first and second microelectronic elements and areconfigured to output the data signals simultaneously from the first andsecond microelectronic elements.

In accordance with one or more examples, the first and secondmicroelectronic elements can be of type LPDDRx.

In accordance with one or more examples, the dielectric element can havefirst and second parallel edges extending between the first and secondsurfaces, a first region of the second surface disposed between thefirst aperture and the first edge, a second region of the second surfacebeing disposed between the second aperture and the second edge, whereinthe terminals include second terminals configured to carry addressinformation for specifying each individual addressable memory locationwithin the memory storage arrays, wherein all of the second terminalsare disposed at locations within at least one of the first and secondregions.

In accordance with one or more examples, each of the first and secondmicroelectronic elements can have first contacts at the respective frontface, and the contacts of the first microelectronic element and thecontacts of the second microelectronic elements are redistributioncontacts which are electrically coupled with the first contacts on therespective microelectronic element through redistribution tracesextending along the front faces of the first and second microelectronicelements.

In accordance with one or more examples, the edge of the firstmicroelectronic element can be a first edge, the first microelectronicelement has a second edge opposite the first edge thereof, and the firstcontacts of the first microelectronic element are disposed adjacent tothe first and second edges thereof, and the first contacts of the secondmicroelectronic element are disposed adjacent to the first and secondedges thereof.

In accordance with one or more examples, the second terminals can bedisposed at locations within each of the first and second regions,wherein signal assignments of the second terminals in the first regionare symmetric about the theoretical axis with the signal assignments ofthe second terminals in the second region.

In accordance with one or more examples, the second terminals in each ofthe first and second regions can include at least some second terminalshaving command information signal assignments, and the signalassignments of the at least some second terminals having commandinformation signal assignments in the first region are symmetric aboutthe theoretical axis with the signal assignments of the at least somesecond terminals having command information signal assignments in thesecond region.

In accordance with one or more examples, the first terminals can includea first group thereof disposed on a first side of a theoretical planeand a second group thereof disposed on a second side of the theoreticalplane opposite from the first side, wherein the first terminals of thefirst group have modulo-X symmetry about the theoretical plane with thesecond group of the first terminals, X being a multiple of 8 and a wholenumber of at least one. In accordance with one or more examples, X canbe a number 2̂n (2 to the power of n), wherein n is greater than or equalto 2.

In accordance with one or more examples, the microelectronic package caninclude leads extending through the apertures, the contacts beingcoupled with the terminals via the leads.

In accordance with one or more examples, the leads can include firstleads extending through the first aperture to the contacts of the firstmicroelectronic element and second leads extending through the secondaperture to the contacts of the second microelectronic element.

In accordance with one or more examples, the dielectric element caninclude bond pads exposed at the second surface and electrically coupledwith the terminals, and the leads include wire bonds extending throughthe apertures from the contacts to the bond pads.

In accordance with one or more examples, the leads can have portionsoverlying the apertures, the contacts being coupled with the terminalsthrough the leads.

In accordance with one or more examples, the first and second aperturescan be elongated in a same direction, the same direction parallel to theedge of the first microelectronic element.

A microelectronic assembly according to an aspect of the invention caninclude a circuit panel having first and second oppositely facingsurfaces, first panel contacts at the first surface, and second panelcontacts at the second surface, respectively. First and secondmicroelectronic packages can be provided each having terminals mountedto the respective panel contacts. Each microelectronic package mayinclude a dielectric element having first and second oppositely facingsurfaces, and having first and second spaced apart apertures eachextending between the first and second surfaces. A first microelectronicelement can have a front face facing the first surface of the dielectricelement, a rear face facing away from the first surface and an edgeextending between the front and rear faces, the first microelectronicelement having contacts exposed at the front face. A secondmicroelectronic element can have a front face partially overlying therear face of the first microelectronic element and facing the firstsurface of the dielectric element, a rear face facing away therefrom andfirst and second opposite edges each of the edges extending between thefront and rear faces of the second microelectronic element. The secondmicroelectronic element can have contacts disposed in a central regionof the front face occupying a middle third of a distance between thefirst and second opposite edges the contacts. The dielectric element ofeach the package can have terminals at the second surface, wherein ineach the package the contacts of the first microelectronic elementoverlie the first aperture and are electrically coupled with theterminals, and the contacts of the second microelectronic elementoverlie the second aperture and are electrically coupled with theterminals. In each such package the terminals may include a plurality offirst terminals between the first and second apertures, the firstterminals configured to carry all data signals for read and write accessto random access addressable memory locations of memory storage arrayswithin the first and second microelectronic elements.

In accordance with one or more examples, the first terminals may includea first group thereof disposed on a first side of a theoretical planeand a second group thereof disposed on a second side of the theoreticalplane opposite from the first side, wherein the first terminals of thefirst group have modulo-X symmetry about the theoretical plane with thesecond group of the first terminals.

In accordance with one or more examples, the first terminals of thefirst microelectronic package may be coupled through the circuit panelwith the first terminals of the second microelectronic package, and thefirst terminals of the first microelectronic package can be alignedwithin one ball pitch in x and y orthogonal directions parallel to thefirst and second surfaces of the circuit panel with the correspondingfirst terminals of the second microelectronic package to which they arecoupled.

In accordance with one or more examples, the first terminals of thefirst microelectronic package can have signal assignments which aremodulo-X equivalent with the corresponding first terminals of the secondmicroelectronic package to which they are coupled through the circuitpanel.

In accordance with one or more examples, the second terminals in thefirst region of the first microelectronic package can be coupled throughthe circuit panel with the second terminals in the second region of thesecond microelectronic package, and the second terminals of the firstregion of the first microelectronic package are aligned within one ballpitch in either one or both of x and y orthogonal directions parallel tothe first and second surfaces of the circuit panel with thecorresponding second terminals of the second region of the secondmicroelectronic package to which they are coupled.

In accordance with one or more examples, second terminals in the secondgroup of second terminals of the first microelectronic package andsecond terminals in the first group of second terminals of the secondmicroelectronic package can be aligned with one another in the x and yorthogonal directions such that the second terminals of the second groupof the first microelectronic package and the second terminals of thefirst group of the second microelectronic package are coincident withone another.

In accordance with one or more examples, at least some of the electricalconnections through the circuit panel between the first terminals of thefirst microelectronic package and the first terminals of the secondmicroelectronic package can have an electrical length of approximately athickness of the circuit panel.

In accordance with one or more examples, the total combined length ofconductive elements connecting a pair of electrically coupled first andsecond panel contacts exposed at the first and second surfaces of thecircuit panel can be less than seven times a smallest pitch of the panelcontacts.

In accordance with one or more examples, the circuit panel can include abus having a plurality of conductors configured to carry all of theaddress information transferred to each of the microelectronic packages.The conductors can extend in a first direction parallel to the first andsecond surfaces, wherein there is no more than one routing layer forglobal routing of all of the address information between a connectionsite on the circuit panel at which the first terminals of the first andsecond microelectronic packages are electrically connected and adifferent connection site on the circuit panel at which the firstterminals of at least a third microelectronic package are electricallyconnected.

In one embodiment, a package can include a first microelectronic elementand having a front face facing a first surface of a dielectric element,and a second microelectronic element having a front face facing a rearsurface of the first microelectronic element and facing towards thefirst surface of the dielectric element. The terminals of the packagecan include first terminals that are disposed at a central region of thesecond surface of the dielectric element that faces away from themicroelectronic assembly, the first terminals configured to carry all ofthe data signals transferred to and from the package for read access andfor write access to random access addressable memory storage locationsof memory storage arrays within the first and second microelectronicelements. For example, the first terminals can include terminals usedfor carrying uni-directional or bi-directional data signals to and/orfrom the first and second microelectronic elements, and data strobesignals, as well as data masks and ODT or “on die termination” signalsused to turn on or off parallel terminations to termination resistors.In one embodiment, terminals configured to carry signals or referencepotentials such as chip select, reset, power supply voltages, e.g., Vdd,Vddq, and ground, e.g., Vss and Vssq, can also be disposed within thecentral region of the dielectric element second surface. In one example,the central region may be such that it is not wider than three andone-half times a minimum pitch between adjacent ones of parallel columnsof the terminals. The central region can be disposed between first andsecond apertures which overlie contacts of the first microelectronicelement and of the second microelectronic element, respectively.

In some embodiments, the microelectronic package may have no more thanfour columns of the first terminals in the central region configured tocarry all of the above-noted data signals described above. In certainembodiments, there may be only two columns of such terminals. In otherembodiments there may only be one column of such terminals. As will befurther described below, in some embodiments, each first terminalassigned to carry a data signal can be electrically coupled with acorresponding contact on a microelectronic element included in thepackage. Alternatively, each such first terminal can be electricallycoupled with a contact on more than one microelectronic element includedin the microelectronic package. As will be further described below withrespect to FIG. 6, in a particular example, the signal assignments offirst terminals can have modulo-X symmetry.

In one embodiment, second terminals can be disposed within peripheralregions of the second surface, a first peripheral region disposedbetween the first aperture and the first peripheral edge, and a secondperipheral region disposed between the second aperture and the secondperipheral edge of the dielectric element. In certain embodiments of theinvention, the second terminals can be configured to carry addressinformation for specifying each individual addressable memory locationwithin the memory storage arrays, and all of the second terminals can bedisposed at locations within at least one of the first and secondregions.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 is a side sectional view of a prior art microelectronic package.

FIG. 2 is a diagrammatic perspective view of a microelectronic assemblyshowing electrical connections between terminals of the microelectronicpackages.

FIG. 3 is a side sectional view of the microelectronic assembly of FIG.2.

FIG. 4 diagrammatic bottom plan view of the electrical connectionsbetween terminals of the microelectronic packages of FIG. 3.

FIG. 5A is a diagrammatic plan view of a microelectronic packageaccording to an embodiment of the present invention.

FIG. 5B is a sectional view of the microelectronic assembly of FIG. 5A,taken along the line B-B of FIG. 5A.

FIG. 5C is a diagrammatic plan view of one of the microelectronicelements shown in FIG. 5A.

FIG. 5D is a diagrammatic plan view of an alternate embodiment of one ofthe microelectronic elements shown in FIG. 5A.

FIG. 5E is one possible sectional view of a microelectronic assemblyincluding two microelectronic packages as shown in FIG. 5A, taken alongthe line B-B of FIG. 5A.

FIG. 5F is another possible sectional view of a microelectronic assemblyincluding two microelectronic packages as shown in FIG. 5A, taken alongthe line B-B of FIG. 5A.

FIG. 5G is a sectional view further illustrating a microelectronicassembly including two microelectronic packages as shown in FIG. 5A,taken along the line B-B of FIG. 5A.

FIG. 5H is a possible diagrammatic perspective view of themicroelectronic assembly of FIG. 5E showing electrical connectionsbetween terminals of the microelectronic packages.

FIG. 5I is a plan view of a microelectronic element comprised in someembodiments of the invention.

FIG. 6 is a diagrammatic bottom plan view of a microelectronic packageaccording to another embodiment of the present invention.

FIG. 7 is a diagrammatic bottom plan view of a microelectronic packageaccording to another embodiment of the present invention.

FIG. 8 is a diagrammatic bottom plan view of a microelectronic packageaccording to another embodiment of the present invention.

FIG. 9 is a diagrammatic bottom plan view of a microelectronic packageaccording to another embodiment of the present invention.

FIG. 10 is a diagrammatic bottom plan view of a microelectronic packageaccording to another embodiment of the present invention.

FIG. 11 is a schematic sectional view illustrating a system according toan embodiment of the invention.

DETAILED DESCRIPTION

In view of the illustrative conventional microelectronic package 112described relative to FIG. 1, the inventors have recognized improvementswhich can be made that may help improve the electrical performance of amicroelectronic package incorporating a memory storage array chip, and amicroelectronic assembly that incorporates such microelectronic package.

Embodiments of the invention herein provide packages that have more thanone semiconductor chip, i.e., a microelectronic element therein. Amultiple chip package can reduce the amount of area or space required toconnect the chips therein to a circuit panel, e.g., printed wiring boardto which the package may be electrically and mechanically connectedthrough an array of terminals, such as a ball grid array, land gridarray or pin grid array, among others. Such connection space isparticularly limited in small or portable computing devices, e.g.,handheld devices such as “smartphones” or tablets that typically combinethe function of personal computers with wireless connectivity to thebroader world. Multi-chip packages can be particularly useful for makinglarge amounts of relatively inexpensive memory available to a system,such as advanced high performance dynamic random access memory (“DRAM”)chips, e.g., in DDR3 type DRAM chips and its follow-ons.

The amount of area of the circuit panel needed to connect the multi-chippackage thereto can be reduced by providing common terminals on thepackage through which at least some signals travel on their way to orfrom two or more chips within the package. However, doing so in a waythat supports high performance operation presents challenges. To avoidundesirable effects such as undesirable reflections of the signal due tounterminated stubs, the traces, vias, and other conductors on a circuitpanel that electrically connect the terminals at the exterior of thepackage with the global wiring on the circuit panel such as the bus 136(FIG. 2) must not be too long. Heat dissipation also presents achallenge for advanced chips, such that it is desirable for at least oneof the large flat surfaces of each chip to be coupled to a heat spreaderor be exposed to or in thermal communication with a flow or air withinan installed system. The packages described below can help to furtherthese goals.

In one example, improvements can be made in a microelectronic packagewhich can be used in an assembly such as shown in FIGS. 2-4, in which apackage 112A is mounted to a surface of a circuit panel with anotherlike package 112B mounted opposite thereto on an opposite surface of thecircuit panel. The packages 112A, 112B typically are functionally andmechanically equivalent to one another. Other pairs 112C and 112D; and112E and 112F, of functionally and mechanically equivalent packagestypically are also mounted to the same circuit panel 134. The circuitpanel and the packages assembled thereto may form a portion of anassembly commonly referred to as a dual in-line memory module (“DIMM”).The packages in each oppositely mounted pair of packages, e.g., packages112A, 112B, connect to contacts on opposite surfaces of the circuitpanel so that the packages in each pair overlie one another typically bymore than 90% of their respective areas. Local wiring within the circuitpanel 134 connects terminals, e.g., the terminals labeled “1” and “5” oneach package to global wiring on the circuit panel. The global wiringincludes the signal conductors of a bus 136 used to conduct some signalsto connection sites on the circuit panel 134 such as sites I, II andIII. For example, the packages 112A, 112B are electrically connected tothe bus 136 by local wiring coupled to a connection site I, the packages112C, 112D are electrically connected to the bus by local wiring coupledto connection site II, and the packages 112E, 112F are electricallyconnected to the bus by local wiring coupled to connection site III.

The circuit panel 134 electrically interconnects the terminals of therespective packages 112A, 112B using local interconnect wiring thatappears similar to a crisscross or “shoelace” pattern in which aterminal labeled “1” near one edge 116 of package 112A connects throughthe circuit panel 134 to a terminal labeled “1” of package 112B near thesame edge 116 of package 112B. However, the edge 116 of the package 112Bas assembled to the circuit panel 134 is far from the edge 116 of thepackage 112A. FIGS. 2-4 further show that a terminal labeled “5” near anedge 122 of the package 112A is connected through the circuit panel 134to a terminal labeled “5” of the package 112B near the same edge 122 ofthe package 112B. In the assembly 138, the edge 122 of the package 112Ais far from the edge 122 of the package 112B.

Connections through the circuit panel between terminals on each package,e.g., the package 112A, to the corresponding terminals on the packagemounted opposite thereto, i.e., the package 112B, are fairly long. Asfurther seen in FIG. 3, in such assembly of like microelectronicpackages 112A, 112B, the circuit panel 134 may electrically interconnecta signal conductor of the bus 136 with the terminal of the package 112Amarked “1” and the corresponding terminal of the package 112B marked“1”, when the same signal from the bus is to be transmitted to eachpackage. Similarly, the circuit panel 134 may electrically interconnectanother signal conductor of the bus 136 with the terminal of the package112A marked “2” and the corresponding terminal of the package 112Bmarked “2”. The same connection arrangement may also apply to othersignal conductors of the bus and corresponding terminals of eachpackage.

Local wiring between the bus 136 on the circuit panel 134 and eachpackage of the respective pair of packages, e.g., the packages 112A,112B (FIG. 2) at a connection site I of the board can be in form ofunterminated stubs. Such local wiring, when relatively long, may in somecases impact the performance of the assembly 138 as discussed below.Moreover, the circuit panel 134 also requires local wiring toelectrically interconnect certain terminals of other packages: the pairof packages 112C and 112D and the pair of packages 112E and 112F to theglobal wiring of the bus 136, and such wiring can also impact theperformance of the assembly in the same way.

FIG. 4 further illustrates the interconnection between themicroelectronic packages 112A, 112B of respective pairs of terminalsassigned to carry signals “1”, “2”, “3”, “4”, “5”, “6”, “7”, and “8”. Asseen in FIG. 4, columns 114 of terminals are disposed near an edge 116of each package which extends in a direction 142. Columns 118 ofterminals are exposed near an opposite edge 122 of each package. Becauselike terminals of the two packages 112A, 112B as used together inassembly 138 are disposed near opposite edges as seen in FIG. 2, wiringmust traverse the circuit panel 134 in a “shoelace pattern” in adirection 140 transverse to direction 142 in which the columns 114, 118extend. Such wiring can be quite long. In recognition that the length ofa DRAM chip can be in the range of ten millimeters on each side, thelength of the local wiring in a circuit panel 134 in an assembly 138seen in FIGS. 2-4 required for some signals to route the same signal tothe corresponding terminals of two oppositely mounted packages 112A,112B can range between five and ten millimeters and may typically beabout seven millimeters.

In some cases, relatively long unterminated wiring on a circuit panelthat connects the terminals of a package may not severely impact theelectrical performance of the assembly 138. However, when a signal istransferred from a bus 136 of the circuit panel to each of multiplepairs of packages connected to the circuit panel as shown in FIG. 2, theinventors recognize that the electrical lengths of the stubs, i.e., thelocal wiring, that extend from the bus 136 to the terminal connectedthereto on each package potentially impacts the performance of theassembly 138. Signal reflections on the unterminated stubs can travel inthe reverse direction from the connected terminals of each package backonto the bus 136, and thus degrade the signals being transferred fromthe bus to the packages. The impacts may be tolerable for some packagescontaining microelectronic elements of current manufacture. However, inpresent or future assemblies that operate with increased signalswitching frequencies, low voltage swing signals, or both, the inventorsrecognize that the impacts can become severe. For these assemblies,settling time, ringing, jitter, or intersymbol interference of atransmitted signal may increase to an unacceptable degree.

The inventors further recognize that the electrical lengths of theunterminated stubs are usually longer than the local wiring thatconnects the bus 136 on the circuit panel with the terminals of thepackages mounted thereto. Unterminated wiring within each package fromthe package terminals to the semiconductor chip therein adds to thelengths of the stubs.

In a specific example, the bus 136 is a command-address bus of anassembly having a predominant memory storage array function such as aDIMM. The command-address bus 136 can be configured to carry addressinformation transferred to the microelectronic packages that is usableby circuitry within the packages, e.g., row address and column addressdecoders, and bank selection circuitry, if present, to determine anaddressable memory location from among all the available addressablememory locations of a memory storage array within a microelectronicelement in the microelectronic packages. The command-address bus 136 canbe configured to carry the above-noted address information to connectionsites, e.g., sites I, II, and III shown in FIG. 2. This above-notedaddress information can then be distributed by local wiring torespective sets of panel contacts on opposite surfaces of the circuitpanel, to which packages 112A, 112B, 112C, 112D, 112E, and 112F areconnected.

In a particular example, when the microelectronic element is or includesa DRAM chip, the command-address bus 136 can be configured to carry allof a group of signals of a command-address bus of the microelectronicelement, i.e., command signals, address signals, bank address signals,and clock signals that are transferred to the microelectronic packages,wherein the command signals include write enable, row address strobe,and column address strobe signals, and the clock signals are clocks usedfor sampling the address signals. While the clock signals can be ofvarious types, in one embodiment, the clock signals carried by theseterminals can be one or more pairs of differential clock signalsreceived as differential or true and complement clock signals.

Accordingly, certain embodiments of the invention described hereinprovide a microelectronic package configured so as to permit the lengthsof stubs to be reduced when first and second such packages are mountedopposite one another on opposite surfaces of a circuit panel, e.g., acircuit board, module board or card, or flexible circuit panel.Assemblies that incorporate first and second microelectronic packagesmounted opposite one another on a circuit panel can have significantlyreduced stub lengths between the respective packages. The reductions inthe lengths of these electrical connections can reduce stub lengths inthe circuit panel and the assembly, which can help improve theelectrical performance, such as reducing settling time, ringing, jitter,or intersymbol interference, among others, for the above-noted signalswhich are carried by the first terminals and which are transferred tomicroelectronic elements in both the first and second packages.Moreover, it may be possible to obtain other benefits as well, such assimplifying the structure of the circuit panel or reducing thecomplexity and cost of designing or manufacturing the circuit panel.

Certain embodiments of the invention provide a package ormicroelectronic assembly in which a microelectronic element, e.g., asemiconductor chip, or stacked arrangement of semiconductor chips, has amemory storage array function. The microelectronic element can beconfigured to predominantly provide a memory storage array function. Insuch microelectronic element, the number of active devices, e.g.,transistors, therein that are configured, i.e., constructed andinterconnected with other devices, to provide the memory storage arrayfunction, is greater than the number of active devices that areconfigured to provide any other function. Thus, in one example, amicroelectronic element such as a DRAM chip may have memory storagearray function as its primary or sole function. Alternatively, inanother example, such microelectronic element may have mixed use and mayincorporate active devices configured to provide memory storage arrayfunction, and may also incorporate other active devices configured toprovide another function such as processor function, or signal processoror graphics processor function, among others. In this case, themicroelectronic element may still have a greater number of activedevices configured to provide the memory storage array function than anyother function of the microelectronic element.

FIGS. 5A and 5B illustrate a particular type of microelectronic package10 configured so as to permit the lengths of stubs to be reduced whenfirst and second such packages are mounted opposite one another onopposite surfaces of a circuit panel, e.g., a circuit board, moduleboard or card, or flexible circuit panel. As seen in FIGS. 5A and 5B,the microelectronic package 10 can include packaging structure, forexample, a dielectric element or substrate 20, e.g., a support elementwhich includes or consists essentially of dielectric material, e.g.,organic or inorganic dielectric material such as, without limitation,oxides, nitrides, or combinations thereof, epoxies, polyimides,thermoset materials or thermoplastics, or other polymeric materials, orcomposite materials such as epoxy-glass, which can be FR-4 or BT resinstructures, or which can be a portion of a tape utilized intape-automated bonding (“TAB”), for example. The dielectric element 20has first and second oppositely facing surfaces 21 and 22.

In some cases, the dielectric element 20 can consist essentially of amaterial having a low coefficient of thermal expansion (“CTE”) in aplane of the substrate (in a direction parallel to the first surface 21of the substrate), i.e., a CTE of less than 12 parts per million perdegree Celsius (hereinafter, “ppm/° C.”), such as a semiconductormaterial e.g., silicon, or a dielectric material such as ceramicmaterial or silicon dioxide, e.g., glass. Alternatively, the substrate20 may include a sheet-like substrate that can consist essentially of apolymeric material such as polyimide, epoxy, thermoplastic, thermosetplastic, or other suitable polymeric material or that includes orconsists essentially of composite polymeric-inorganic material such as aglass reinforced structure of BT resin (bismaleimide triazine) orepoxy-glass, such as FR-4, among others. In one example, such asubstrate 20 can consist essentially of a material having a CTE of lessthan 30 ppm/° C. in the plane of the dielectric element, i.e., in adirection along its surface.

In FIGS. 5A and 5B, the directions parallel to the first surface 21 ofthe dielectric element 20 are referred to herein as “horizontal” or“lateral” directions, whereas the directions perpendicular to the firstsurface are referred to herein as upward or downward directions and arealso referred to herein as the “vertical” directions. The directionsreferred to herein are in the frame of reference of the structuresreferred to. Thus, these directions may lie at any orientation to thenormal “up” or “down” directions in a gravitational frame of reference.

A statement that one feature is disposed at a greater height “above asurface” than another feature means that the one feature is at a greaterdistance in the same orthogonal direction away from the surface than theother feature. Conversely, a statement that one feature is disposed at alesser height “above a surface” than another feature means that the onefeature is at a smaller distance in the same orthogonal direction awayfrom the surface than the other feature.

First and second apertures 26 a, 26 b can extend between the first andsecond surfaces 21, 22 of the dielectric element 20. As can be seen inFIG. 5A, the dielectric element 20 can have two apertures 26 a and 26 bextending therethrough. The longest dimensions of the apertures 26 a and26 b can define first and second parallel axes 29 a and 29 b(collectively axes 29). The first and second parallel axes 29 a and 29 bcan define a central region 23 of the second surface 22 of thedielectric element 20 located between the axes 29 a and 29 b. A firstperipheral region 28 a of the second surface is disposed between axis 29a and the peripheral edge 27 a of the dielectric element. A secondperipheral region 28 b of the second surface is disposed between axis 29b and a peripheral edge 27 b of the dielectric element opposite fromperipheral edge 27 a. Hereinafter, a statement that a terminal isdisposed between an aperture of a substrate and a given feature of asubstrate or package such as a peripheral edge thereof shall mean thatthe terminal is disposed between an axis of the aperture and the givenfeature.

The dielectric element 20 can have a plurality of terminals 25, e.g.,conductive pads, lands, or conductive posts at the second surface 22 ofthe dielectric element 20. As used in this disclosure with reference toa component, e.g., an interposer, microelectronic element, circuitpanel, substrate, etc., a statement that an electrically conductiveelement is “at” a surface of a component indicates that, when thecomponent is not assembled with any other element, the electricallyconductive element is available for contact with a theoretical pointmoving in a direction perpendicular to the surface of the componenttoward the surface of the component from outside the component. Thus, aterminal or other conductive element which is at a surface of asubstrate may project from such surface; may be flush with such surface;or may be recessed relative to such surface in a hole or depression inthe substrate.

The terminals 25 can function as endpoints for the connection of themicroelectronic package 10 with corresponding electrically conductiveelements of an external component such as the contacts of a circuitpanel, e.g., printed wiring board, flexible circuit panel, socket, othermicroelectronic assembly or package, interposer, or passive componentassembly, among others (e.g., the circuit panel 60 or 60′ shown in FIG.5E or FIG. 5F). In one example, such a circuit panel can be amotherboard or DIMM module board.

In one example, terminals 25 a that are disposed in the central region23 of the second surface 22 of the dielectric element 20 can beconfigured to carry data signals. These terminals are referred to hereinas “first terminals.” In one example, the first terminals can beconfigured to carry one or more of data strobe signals, or other signalsor reference potentials such as chip select, reset, power supplyvoltages, e.g., Vdd, Vddq, and ground, e.g., Vss and Vssq. The firstterminals 25 a may include terminals assigned to carry data signals andalso data masks and “on die termination” (ODT) signals used to turn onor off parallel terminations to termination resistors.

Typically, the first terminals are configured to carry allbi-directional data signals for writing of data to and for reading ofdata from random access addressable locations of at least a main memorystorage array within each DRAM microelectronic element. However, in somecases some of the first terminals can carry uni-directional data signalsfor input to a microelectronic element for writing of data to a memorystorage array, and some of the first terminals can carry uni-directionaldata signals output from a microelectronic element based on data readfrom a memory storage array.

The microelectronic package 10 can include joining elements 11 attachedto the terminals 25 for connection with an external component. Thejoining elements 11 can be, for example, masses of a bond metal such assolder, tin, indium, a eutectic composition or combination thereof, oranother joining material such as an electrically conductive paste, anelectrically conductive adhesive or electrically conductive matrixmaterial or a combination of any or all of such bond metals orelectrically conductive materials. In a particular embodiment, thejoints between the terminals 25 and contacts of an external component(e.g., the circuit panel 60 shown in FIG. 5E) can include anelectrically conductive matrix material such as described in commonlyowned U.S. patent application Ser. Nos. 13/155,719 and 13/158,797, thedisclosures of which are hereby incorporated herein by reference. In aparticular embodiment, the joints can have a similar structure or beformed in a manner as described therein.

The microelectronic package 10 can comprise a plurality ofmicroelectronic elements 30 each having a front face 31 facing the firstsurface 21 of the dielectric element 20. Although the microelectronicelements 30 are shown in FIG. 5A and the other figures as being offsetfrom one another in a direction parallel to the axes 29, that need notbe the case. Such an offset of the microelectronic elements 30 is shownin the figures for improved clarity of the overlying location of themicroelectronic elements with respect to one another. In a particularembodiment, peripheral edges 34 a of each of the microelectronicelements 30 can lie in a first common plane, and peripheral edges 34 bopposite the peripheral edges 34 a of each of the microelectronicelements can lie in a second common plane.

In one example, the microelectronic elements 30 can each comprise amemory storage element such as a dynamic random access memory (“DRAM”)storage array or that is configured to predominantly function as a DRAMstorage array (e.g., a DRAM integrated circuit chip). As used herein, a“memory storage element” refers to a multiplicity of memory cellsarranged in an array, together with circuitry usable to store andretrieve data therefrom, such as for transport of the data over anelectrical interface.

As further seen in FIGS. 5C and 5D, each microelectronic element 30 canhave a plurality of electrically conductive element contacts 35 exposedat the front surface 31 thereof. The contacts 35 of each microelectronicelement 30 can be arranged in one (FIG. 5C) or in two or more (FIG. 5D)columns 36 disposed in a central region 37 of the front face 31 thatoccupies a central portion of an area of the front face. As used hereinwith respect to a face (e.g., a front face, a rear face) of amicroelectronic element, “central region” means an area, such as region37, occupying a middle third 41 c of a distance 38 between oppositeperipheral edges 32 a, 32 b of the microelectronic element 30 in adirection orthogonal to the edges 32 a, 32 b. The central region 37 isdisposed between peripheral regions 43 a, and 43 b, each of which liesbetween the central region 37 and a respective peripheral edge 32 a or32 b, and each peripheral region also occupying an area covering arespective third 41 a or 41 b of the distance 38 between the oppositeperipheral edges 32 a, 32 b. In the particular example shown in FIG. 5C,when the contacts 35 of each microelectronic element 30 are arranged ina central region 37 of the microelectronic element, the contacts can bearranged along an axis 39 that bisects the microelectronic element. Asshown in FIG. 5B, the contacts 35 of each microelectronic element 30 canbe aligned with at least one of the apertures 26. In one example, thecontacts of microelectronic element 30 a can be aligned only with one ofthe apertures 26 and the contacts of microelectronic element 30 b can bealigned only with the other one of the apertures 26.

Electrical connections between the contacts 35 and the terminals 25 a,25 b, 125 b can include leads, e.g., wire bonds 40, or other possiblestructure in which at least portions of the leads are aligned with atleast one of the apertures 26. For example, as seen in FIG. 5B, at leastsome of the electrical connections can include a wire bond 40 thatextends beyond an edge of an aperture 26 in the dielectric element 20,and is joined at one end to the contact 35 of a microelectronic elementand to a conductive element 24 of the dielectric element 20 at anotherend. In one embodiment, at least some of the electrical connectionsbetween the dielectric element and the contacts of the microelectronicelement can be through lead bonds, i.e., leads which are integral withother conductive elements on the dielectric element and which extend ina lateral direction along one or both of the first and second surfaces21, 22 of the dielectric element 20 and are bonded to contacts of one ormore of the microelectronic elements, each lead having a portion alignedwith at least one of the apertures 26.

In operation, at least some signals that pass through the firstterminals 25 a of the package can be common to at least two of themicroelectronic elements 30. These signals can be routed throughconnections such as conductive traces extending on or within thedielectric element 20 in directions parallel to the first and secondsurfaces 21, 22 of the dielectric element from the terminals 25 to thecorresponding contacts 35 of the microelectronic elements 30. Forexample, a first terminal 25 a disposed in the central region 23 of thesecond surface 22 of the dielectric element 20 can be electricallycoupled with a conductive contact 35 of each microelectronic element 30through a conductive trace, a conductive element 24, e.g., a bond pad,and a wire bond 40 joined to the conductive element 24 and the contact35.

In one example, as further shown in FIG. 6, the first terminals ofmicroelectronic package 210 can be configured to have modulo-X symmetry.In this arrangement, the assignments of the data signals to the spatialpositions of the second terminals on the microelectronic package, suchas for data signals DQ0, DQ1, . . . , for example, have modulo-Xsymmetry about a theoretical vertical axis 132. The modulo-X symmetrycan help improve signal integrity in an assembly 381 or 382 such as seenin FIGS. 5E and 5F, in which one or more pairs of first and secondpackages 10 a, 10 b are mounted opposite one another to a circuit panel,and electrically conductive structure on which data signals aretransmitted on the circuit panel are electrically coupled withcorresponding pairs of first terminals of those first and secondpackages in each oppositely mounted package pair.

As used herein, “modulo-X” means the modulo operation, wherein “X” isone of: a number defined by 2̂n (2 to the power of n), wherein n is awhole number greater than or equal to 2; or 8×N, N being a whole numbergreater than 2. Thus, in various examples, X can be equal to the numberof bits in a half-byte (4 bits), a byte (8 bits), or any whole number ofbytes (8×N, N being two or more). Modulo-X symmetry is defined asfollows. When the signal assignments of terminals have “modulo-Xsymmetry” about an axis 132 such as depicted in FIG. 6, terminals thathave signal assignments numbered the same after performing the“modulo-X” operation are disposed at positions which are symmetric aboutthe axis. An example is provided regarding the operation modulo-8 asfollows. A number resulting from performing the modulo-8 operation onthe operand 8 is 0. This operation can stated as “8 modulo 8=0”.Similarly, a number resulting from performing the operation 9 modulo 8is 1. Therefore, when the signal assignments have modulo-8 symmetry, aterminal which is configured to carry a signal such as DQ1, for whichthe modulo-8 operation yields a result of “1”, is disposed at a positionon the substrate which is symmetric about an axis with another terminalconfigured to carry a signal such as DQ9 or DQ17 for which the modulo 8operation yields the same result, i.e., “1”.

Thus, in one example, when there is modulo-8 symmetry as shown in FIG.6, the signal assignment of a package terminal DQ0 in group 225 isconfigured to carry data signal DQ0 is symmetric about the vertical axis132 with the signal assignment of another package terminal DQ8configured to carry data signal DQ8. The same is true for the signalassignments of package terminals DQ0 and DQ8 in group 227 about thevertical axis. Modulo-8 symmetry such as described herein can be seen ineach of the terminal groups 225 and 227 with respect to each of thesignal assignments of package terminals DQ0 through DQ15. In an assembly381 or 382 such as in FIG. 5E or FIG. 5F, modulo-X symmetry can permitthe electrical connections between first terminals of a first package 10a and a second package 10 b to be made between terminals which arealigned within one ball pitch of one another in x and y directionsparallel to the surface 61 of the circuit panel. Thus, in the exampleseen in FIG. 5E, a terminal DQ0 of a first package 10 a can beelectrically connected to a terminal DQ8 of the second package 10 bthrough connection “A” connected to package 10 a, the circuit panel 60,and connection “A*” connected to package 10 b. In this case, the numberscorresponding to the data signal assignments of the terminals atconnection “A” to package 10 a and at connection “A*” to package 10 b,respectively, differ by the modulo-X operation (X being 8 in this case).As seen in FIG. 5E, Vias 67 can extend straight through the circuitpanel in a direction orthogonal to surface 60. In the example in FIG.5E, the electrical connections between the terminals may extend throughthe vias 67 as well as some wiring 66, 68 that extends in one or moredirections parallel or substantially to surfaces 61, 62 of the circuitpanel.

In a further example shown in FIG. 5F, the electrical connectionsbetween the first terminals of the first and second packages 10 a, 10 bcan be made even shorter, wherein some or all of the wiring 66, 68 canbe omitted and the connection between a first terminal of package 10 aat “A” and a corresponding first terminal of package 10 b at “A*” can bemade in a direction essentially straight through, i.e., normal to, thethickness of the circuit panel.

In addition, as further seen in FIG. 6, the microelectronic package 210can include two groups 225, 227 of first terminals, each group of whichincludes 16 DQ terminals electrically coupled to 16 DQ contacts of oneor more of the microelectronic elements 30 a, 30 b included in thepackage 210. The two groups of first terminals can be utilized invarying ways as will be described further below in accordance with thesection below relating to a co-support aspect of the invention.

Referring again to FIG. 5B, a spacer 14 can be positioned between thefront surface 31 of the second microelectronic element 30 b and aportion of the first surface 21 of the dielectric element 20. Such aspacer 14 can be made, for example, from a dielectric material such assilicon dioxide, a semiconductor material such as silicon, and mayinclude one or more layers 13, 15 of adhesive, or may be adhered to thesecond microelectronic element 30 b and the dielectric element 20through such adhesive layers. In one embodiment, the spacer 14 can havesubstantially the same thickness T1 in a vertical direction Vsubstantially perpendicular to the first surface 21 of the dielectricelement 20 as the thickness T2 of the first microelectronic element 30 abetween the front and rear surfaces 31, 33 thereof.

In addition, the one or more adhesive layers 13, 15 can be positionedbetween the first microelectronic element 30 a and the dielectricelement 20, between the first and second microelectronic elements 30 aand 30 b, between the second microelectronic element 30 b and the spacer14, and between the spacer 14 and the dielectric element 20. Suchadhesive layers can include adhesive for bonding the aforementionedcomponents of the microelectronic package 10 to one another. In aparticular embodiment, the one or more adhesive layers 13 can extendbetween the first surface 21 of the dielectric element 20 and the frontsurface 31 of the first microelectronic element 30 a. In one embodiment,the one or more adhesive layers 13 can attach at least a portion of thefront surface 31 of the second microelectronic element 30 b to at leasta portion of the rear surface 33 of the first microelectronic element 30a.

In one example, each adhesive layer 13 can be partly or entirely made ofa die attachment adhesive and can be comprised of a low elastic modulusmaterial such as silicone elastomer. In one embodiment, the dieattachment adhesive can be compliant. In another example, each adhesivelayer 13 can be entirely or partly made of a thin layer of high elasticmodulus adhesive or solder if the two microelectronic elements 30 areconventional semiconductor chips formed of the same material, becausethe microelectronic elements will tend to expand and contract in unisonin response to temperature changes. Regardless of the materialsemployed, each of the adhesive layers 13 can include a single layer ormultiple layers therein. In a particular embodiment where the spacer 14is made from an adhesive, the adhesive layers 13 positioned between thespacer 14 and the second microelectronic element 30 b and the dielectricelement 20 can be omitted.

The microelectronic package 10 can also include an encapsulant 50 thatcan optionally cover, partially cover, or leave uncovered the rearsurfaces 33 of the microelectronic elements 30. For example, in themicroelectronic package 10 shown in FIG. 5B, an encapsulant can beflowed, stenciled, screened or dispensed onto the rear surfaces 33 ofthe microelectronic elements 30. In another example, the encapsulant 50can be a mold compound which is formed thereon by overmolding.

The microelectronic package 10 can further include an encapsulant (notshown) that can optionally cover the wire bonds 40 and the conductiveelements 24 of the dielectric element 20. Such an encapsulant can alsooptionally extend into the apertures 26, and it can cover the contacts35 of the microelectronic elements 30.

The microelectronic elements 30 in a microelectronic package 10 can beconfigured in accordance with one of several different standards, e.g.,standards of JEDEC, which specify the type of signaling thatsemiconductor chips (such as the microelectronic elements 30) transmitand receive through the contacts 35 thereof. Thus, in one example, eachof the microelectronic elements 30 can be of DDRx type, i.e., configuredin accordance with one of the JEDEC double data rate DRAM standardsDDR3, DDR4, or one or more of their follow-on standards (collectively,“DDRx”). Each DDRx type microelectronic element can be configured tosample the command and address information coupled to the contactsthereof at a first sampling rate, such as once per clock cycle (e.g., onthe rising edge of the clock cycle). In particular examples, the DDRxtype microelectronic elements can have four, eight or sixteen contactsused for transmitting and receiving bi-directional data signals, eachsuch bi-directional signal referred to as a “DQ” signal. Alternatively,the first terminals of a package can be configured to carryuni-directional data signals such as data signals or “D” signals inputto the package and data signals “Q” output from the package, or can beconfigured to carry a combination of bi-directional and uni-directionaldata signals.

As further seen in FIG. 5A, in addition to first terminals 25 a, groups25 b, 125 b of second terminals can be disposed in first peripheralregion 28 a and in second peripheral region 28 b of the second surface,respectively. Each of the groups of second terminals 25 b, 125 bcomprises terminals configured to carry address information. Forexample, when the microelectronic elements 30 a, 30 b include or areDRAM semiconductor chips, each group of second terminals 25 b, 125 b canbe configured to carry sufficient address information transferred to themicroelectronic package 10 that is usable by circuitry within thepackage, e.g., row address and column address decoders, and bankselection circuitry of one or more of the microelectronic elements 30 todetermine an addressable memory location from among all the availableaddressable memory locations of a memory storage array within amicroelectronic element in the package. In a particular embodiment, eachgroup of the second terminals 25 b, 125 b can be configured to carry allthe address information used by such circuitry within themicroelectronic package 10 to determine an addressable memory locationwithin such memory storage array.

In one example, the second terminals disposed in the first peripheralregion have signal assignments which are symmetric about a theoreticalaxis with the signal assignments of second terminals disposed in thesecond peripheral region. The theoretical axis extends parallel to thelongitudinal axis of each of the apertures and is disposed between theproximate edges of the respective apertures. Typically, the theoreticalaxis is disposed at or near the median distance between the proximateedges of the respective apertures. “Symmetric” as used herein inconnection with signal assignments of terminals for carrying addressinformation means that the signal assignment of a terminal on a firstside of the theoretical axis has a name and numerical weight which arethe same as that of another terminal on an opposite side of the axis ata position symmetric about the axis from the terminal on the first side.The “numerical weight” of the address information assigned to a giventerminal refers to the place of that address information within theplaces of an address that is specified by the address information. Forexample, an address can be specified by 20 address bits A0 . . . A19.Each bit has a numerical weight, from the highest-ordered addressinformation bit A19, which has a numerical weight of 19 representing 2̂19(2 to the power of 19), to the lowest-ordered address information bitA0, which has a numerical weight of zero representing 2̂0 (2 to the powerof zero), which is the 1's place of the address.

In one example, the second terminals can be configured to carry each ofa group of signals of a command-address bus of the microelectronicelement; i.e., command signals, address signals, bank address signals,and clock signals that are transferred to the microelectronic package,wherein the command signals include write enable, row address strobe,and column address strobe signals, and the clock signals are clocks usedfor sampling the address signals. While the clock signals can be ofvarious types, in one embodiment, the clock signals carried by theseterminals can be one or more pairs of differential clock signalsreceived as differential or true and complement clock signals.

On a circuit panel, e.g., a printed circuit board, module card, etc.,these above-noted signals of the command-address bus: i.e., commandsignals, address signals, bank address signals, and clock signals, canbe bussed to multiple microelectronic packages that are connectedthereto in parallel, particularly to first and second microelectronicpackages mounted to opposite surfaces of the circuit panel in aclamshell configuration as seen in FIGS. 5E through 5H, for example. Insuch configuration, for certain embodiments herein, first and secondgroups of the second terminals can be disposed in respective first andsecond regions of a surface of a package substrate, with the addressinformation signal assignments of the terminals having mirror-imagesymmetry. For example, each second terminal of the first group of secondterminals, such second terminal being on a first side of theoreticalaxis, has a signal assignment which is symmetric about the theoreticalaxis with a corresponding second terminal of the second group of secondterminals. In the case of address information, two terminals whosesignal assignments have symmetry about the theoretical axis means eachof the two terminals is assigned to carry address information having thesame weight. In the case of command information, such as, for example,RAS, CAS, CLK, /CLK, and write enable, two terminals whose signalassignments have symmetry about the theoretical axis means that each ofthe two terminals is assigned to carry command information which has thesame name. In the case of either second terminals which are configuredto carry address or command information, symmetry is still present evenif the second terminals in the respective first and second groups haverespective identifiers: e.g., the second terminals at the correspondingpositions separated by the theoretical axis have signal assignments ofthe same weight and are identified as A19-A and A19-B, for example.

In one example of a microelectronic package, a first group of the secondterminals on a first side of theoretical axis can be electricallycoupled with one of the first and second microelectronic elements, andthe second group of second terminals on a second side of theoreticalaxis can be electrically coupled with another one of the first andsecond microelectronic elements. In a particular example, the firstgroup of second terminals can be electrically coupled with a first rankor first channel of memory access in the package, and the second groupof second terminals can b e electrically coupled with a second rank orsecond channel of memory access in the package.

The presence of first and second groups of second terminals on thepackage having symmetry as described above can help to reduce thelengths of stubs used to carry signals from an address bus, e.g., acommand-address bus 136 as seen in FIG. 2 on the circuit panel to theindividual connection sites on the surfaces of the circuit panel wherethe microelectronic packages are electrically connected. The reductionsin the lengths of these electrical connections can reduce stub lengthsin the circuit panel and the assembly, which can help improve theelectrical performance, such as reducing settling time, ringing, jitter,or intersymbol interference, among others, for the above-noted signalsthat are carried by the first terminals and that are transferred tomicroelectronic elements in both the first and second packages.Moreover, it may be possible to obtain other benefits as well, such assimplifying the structure of the circuit panel or reducing thecomplexity and cost of designing or manufacturing the circuit panel.

Moreover, it may be possible to reduce the number of routing layers ofwiring on the circuit panel required to route signals to and fromcontacts on first and second surfaces (e.g., top and bottom surfaces) ofa circuit panel to which the second terminals of first and secondmicroelectronic packages are connected, respectively. Specifically, thenumber of routing layers required to route such data signals along thecircuit panel may in some cases be reduced to four or fewer routinglayers. In a particular example, the number of routing layers requiredto route such signals along the circuit panel may in some cases bereduced to four, two, or one routing layers. However, on the circuitpanel, there may be a greater number of routing layers that carry othersignals than the number of routing layers that carry the above-notedaddress or command-address bus signals.

In a variation of such embodiment, the second terminals 25 a can beconfigured to carry a majority of the address information that is usedby such circuitry within the microelectronic package 10 to determine anaddressable memory location within such memory storage array, and thenterminals disposed elsewhere on the package such as in central region 23can be configured to carry the remaining part of the addressinformation. In such variation, in a particular embodiment, the secondterminals 25 b, 125 b can be configured to carry three-quarters or moreof the address information that is used by such circuitry within themicroelectronic package 10 to determine an addressable memory locationwithin such memory storage array.

In a particular embodiment, the groups of second terminals 25 b, 125 bmay not be configured to carry chip select information, e.g.,information usable to select a particular chip within themicroelectronic package 10 for access to a memory storage locationwithin the chip. In another embodiment, at least one of the firstterminals 25 a may indeed carry chip select information.

In a variation of any of the foregoing embodiments, the spacer 14 can bereplaced fully or partially by one or more microelectronic elementsincluding buffer element, i.e., a chip that is configured to perform abuffering function, such microelectronic element having a surface facingthe first surface 21 of the dielectric element 20. In one example, suchbuffer element can be flip-chip bonded to contacts exposed at the firstsurface 21 of the dielectric element 20. Each such buffer element can beused to provide signal isolation between terminals of the package,particularly for the above-noted command address bus signals received atthe second terminals of the package, and one or more of themicroelectronic elements in the package. In one example, such bufferelement can be electrically connected to at least some of the terminalsand one or more of the microelectronic elements 30 in themicroelectronic package 10, the buffer element being configured toregenerate at least one signal received at one or more of the terminalsof the microelectronic package. Typically, the one or more bufferelements regenerate signals received at the first terminals, or whichare received at the second terminals, and transfers the regeneratedsignals to the microelectronic elements in the package.

In a particular example, such buffer element can be configured to bufferthe address information, or in one example, the command signals, addresssignals, clock signals, or data signals that are transferred to one ormore of the microelectronic elements 30 a and 30 b. Alternatively, or inaddition to regenerating signals as described above, in a particularexample, such an additional microelectronic element can be configured topartially or fully decode at least one of address information or commandinformation received at the terminals, such as at the first terminals.The decoding chip can then output the result of such partial or fulldecoding for transfer to one or more of the microelectronic elements 30a and 30 b.

In a particular embodiment, instead of or in addition to the bufferelement and/or the decoding chip, one or more decoupling capacitors canbe disposed in at least a portion of the space occupied by the spacer14, and such decoupling capacitors can be electrically connected tointernal power supply and/or ground buses inside the microelectronicpackage 10.

With further reference to the examples of microelectronic packagesdescribed above, each microelectronic package can be configured inaccordance with one of first and second types, wherein eachmicroelectronic package can be arranged with a pattern of terminalsthereon, hereinafter referred to as the “ballout” of each package. Inaccordance with a co-support aspect of the invention, each suchmicroelectronic package can be configured for ready attachment andelectrical coupling to contacts of the same pattern of contacts on acircuit panel. In accordance with this aspect of the invention,terminals of the first type of package are configured for connectionwith a majority of the contacts of the pattern on the substrate. Inaddition, the terminals of the second type of package are configured forconnection with a majority of the contacts of the pattern on thesubstrate.

Thus, in accordance with this co-support aspect, the package 10 seen inFIGS. 5A-5H may comprise DDRx type microelectronic elements. With DDRxtype microelectronic elements, the package 10 may have a firstconfiguration in which memory storage arrays of the first and secondmicroelectronic elements 30 a, 30 b thereof collectively function toprovide access to a single relatively wide rank of memory. For example,a single package 10 can provide a single rank of 32 bit memory access inwhich 16 DQ contacts of the first microelectronic element 30 a arecoupled to a first group 123 of the DQ terminals 25 a on the packageassigned to carry sixteen bi-directional data signals DQ0 . . . DQ15 asseen in FIG. 5A, and 16 DQ contacts of the second microelectronicelement 30 b are coupled to a second, different group 127 of the DQterminals 25 a on the package which are assigned to carry sixteen otherbi-directional data signals DQ0 . . . DQ15. In this case, thirty-twobi-directional data signals are transferred in tandem on the thirty-twoDQ terminals to support the 32 bit single rank memory access.Specifically, 32 bi-directional data signals are receivedsimultaneously, i.e., on the same clock cycle by said first and secondmicroelectronic elements through said 32 DQ terminals and 32bi-directional data signals are output simultaneously, on the same clockcycle, by said first and second microelectronic elements through said 32DQ terminals.

In another example, with DDRx type microelectronic elements, the package10 seen in FIGS. 5A-5H may have a second configuration which supportsaccess to two ranks of memory access which are not as wide as the 32 bitsingle rank described above. For example, a single package 10 canprovide access to one 16 bit rank of memory through 16 first terminalsDQ0A through DQ15A which are coupled to 16 DQ contacts of a firstmicroelectronic element 30 a. The single package 10 can also provideaccess to another 16 bit rank of memory through 16 first terminals DQ0Bthrough DQ15B which are coupled to the 16 DQ contacts of the secondmicroelectronic element 30 b. Alternatively, since the package 10provides access to dual 16 bit ranks, it may be possible to omit one ofthe groups 123 or 127 of the first terminals on the package, becausealternatively, 16 DQ terminals on the package can be electricallycoupled to 16 corresponding contacts on each of the microelectronicelements, as memory storage arrays in each microelectronic element 30 a,30 b are accessed in turn rather than simultaneously.

In another example, each of the microelectronic elements 30 can be ofLPDDRx type, i.e., configured in accordance with one of the JEDEC lowpower double data rate DRAM standards LPDDR3 or one or more of itsfollow-on standards (collectively, “LPDDRx”). LPDDRx type DRAM chips areavailable which have 32 contacts assigned to carry DQ signals. There areother differences as well. Each contact 35 on a LPDDRx type DRAM chipmay be used to simultaneously carry two different signals in interleavedfashion. For example, each contact 35 on such DRAM chip can be assignedto carry one signal which is sampled on the rising edge of the clockcycle and can also be assigned to carry another signal which is sampledon the falling edge of the clock cycle. Thus, in LPDDRx type chips, eachmicroelectronic element 30 a, 30 b can be configured to sample thecommand and address information input to the contacts thereof at asecond sampling rate, such as twice per clock cycle (e.g., on both therising edge and on the falling edge of the clock cycle). Accordingly,the number of contacts on the LPDDRx DRAM chip which carry addressinformation or command-address bus information can also be reduced.

In still other examples, microelectronic elements 30 of amicroelectronic package 10 of LPDDRx type can be configured to samplethe command and address information coupled thereto at a sampling ratewhich is an integer multiple of a sampling rate at which command andaddress information are sampled in a DDRx type chip, e.g., such as atfour times per clock cycle (e.g., once each on every quarter of theclock cycle). In yet another embodiment, the second sampling rate can bea non-integer multiple of the first sampling rate. For example, thesecond sampling rate may be non-integer multiple of 1.5 times the firstsampling rate.

Besides the specific examples described above, the inventioncontemplates many other integer and non-integer multiple relationshipsbetween the second sampling rate and the first sampling rate, inexamples where sampling of the command and address information by themicroelectronic elements 30 is performed during every clock cycle, andin examples where sampling of the command and address information by themicroelectronic elements is only performed during some clock cycles butnot other clock cycles.

In one example, each LPDDRx microelectronic element may comprise asemiconductor chip of LPDDRx type with an additional wiring layer on asurface thereof electrically coupled with the contacts of such chip. Astypically manufactured, semiconductor chips of LPDDRx type have columnsof contacts disposed adjacent to first and second oppositely facingedges of the chip. Redistribution wiring can be provided to redistributethe contacts from their original positions to redistribution contactsprovided in a central region of the front face of the chip as describedabove. For example, on LPDDRx microelectronic element 130 as seen inFIG. 5I typically has rows 135 a, 135 b of peripheral contacts adjacentto and parallel to peripheral edges 34 a, 34 b, respectively, of thesemiconductor chip. Redistribution wiring in the form of traces 137extending along the front face of the semiconductor chip canelectrically couple the rows 135 a, 135 b of peripheral contacts withcolumns of redistributed contacts 235 a, 235 b disposed in a centralregion at the front face of the microelectronic element 130. Then, theLPDDRx microelectronic element 30 is assembled with another suchmicroelectronic element 130 in a microelectronic package 10 as describedin the foregoing.

As shown, the redistribution wiring can include features 139 whichprovide trace length matching for the connections between the rows 135a, 135 b of peripheral contacts and the redistributed contacts incolumns 235 a, 235 b. Such trace length matching features can be used toreduce differences in propagation delay of signals within a group ofsignals along the redistribution wiring between the peripheral contactsand the redistributed contacts. Performance can be improved by reducingthese differences in propagation delay, which can help facilitateoperation at increased sampling clock rates.

In one example, a package 10 having LPDDRx type microelectronic elements30 a, 30 b, can have a configuration which supports two relatively wideranks of memory. For example, a single package 310 as seen in FIG. 7 canprovide two ranks of 32 bit memory access. In one such example, 32 firstterminals 323 on the package 310 can be coupled with 32 DQ contacts ofthe first microelectronic element 30 a, and can also be coupled with 32DQ contacts of the second microelectronic element 30 b

Referring again to FIG. 5E, in accordance with an aspect of theinvention, first and second microelectronic packages 10 a, 10 b canassembled with a circuit panel 60 in a clamshell arrangement.Specifically, as seen in FIG. 5E, the packages 10 a, 10 b can be mountedopposite one another to respective panel contacts at first and secondsurfaces 61, 62 of a circuit panel 60, such that the first package 10 aoccupies the same or substantially the same area of the circuit panel asthe second package 10 b. Each of the microelectronic packages can have asimilar structure which includes first and second microelectronicelements as described above. In FIG. 5E, for ease of illustration anddescription, the first terminals 15 a, 25 a on each respective packageare shown only at two different positions in a widthwise direction Wthat extends between the first and second apertures of each package. Asdescribed in the foregoing, the first terminals can be spread out over agreater number of positions in the widthwise direction W. In oneembodiment, the first terminals may be disposed at positions within agreater number of parallel columns of terminals, for example fourparallel columns of terminals spaced at even or uneven intervals in thewidthwise direction.

The modulo-X symmetric arrangement of first terminals 25 a of packages10 a, 10 b permit these terminals which are electrically connected toone another to be aligned to less than one ball pitch in x and ydirections parallel to the surface 22 of the dielectric element.

Referring now to FIG. 5E, a microelectronic assembly 381 can include twoor more microelectronic packages 10, for example, first and secondmicroelectronic packages 10 a, 10 b that can be mounted to a commoncircuit panel 60. The circuit panel 60 can have first and secondopposing surfaces 61 and 62 and pluralities of electrically conductivefirst and second panel contacts 65 a and 65 b (collectively panelcontacts 65) exposed at the respective first and second surfaces. Themicroelectronic packages 10 can be mounted to the panel contacts 65, forexample, by the joining elements 11 that can extend between theterminals 25 and the panel contacts. As shown in FIG. 5E, the secondsurface 22 of the dielectric element 20 of the first microelectronicpackage 10 a and the second surface of the dielectric element of thesecond microelectronic package 10 b can overlie at least 90% of oneanother. In a particular example, the circuit panel 60 can include anelement having a CTE less than 30 ppm/° C. In one embodiment, such anelement can consist essentially of semiconductor, glass, ceramic orliquid crystal polymer material.

In the microelectronic assemblies 381 depicted in FIGS. 5E and 5F, onlythe first terminals 25 a of each microelectronic package are shown. Thesecond terminals are omitted from the view for ease of illustration anddescription, although such second terminals are not omitted from theassembly. The second terminals of each microelectronic package 10 can bemounted to corresponding ones of the panel contacts 65, for example, byjoining elements such as the joining elements 11 that can extend betweenthe second terminals and the panel contacts.

The first terminals 25 a of the first microelectronic package 10 a canbe electrically connected to the first terminals of the secondmicroelectronic package 10 b through the circuit panel 60. As shown inFIG. 5A, the first terminals 25 a of the first microelectronic package10 a can be aligned within one ball pitch of the corresponding firstterminals 25 a to which they are connected of the second microelectronicpackage 10 b. The modulo-X symmetric arrangement of first terminals 25 aof packages 10 a, 10 b permit these terminals which are electricallyconnected to one another, to be aligned to less than one ball pitch in xand y directions parallel to the surface 22 of the dielectric element.

As used herein, alignment within a particular number of ball pitchesmeans aligned within the particular number of ball pitches with respectto a horizontal direction perpendicular to the first surface of thedielectric element. In an exemplary embodiment, each pair ofelectrically connected first terminals of the respective first andsecond packages 10 a, 10 b can be aligned within one ball pitch of oneanother in orthogonal x and y directions parallel to the first surface61 of the circuit panel 60.

In one embodiment, the first terminals of the respective first andsecond microelectronic packages 10 a and 10 b can be functionally andmechanically matched, such that each of first and second groups 15 a and15 b of first terminals can have the same pattern of first terminals 25a at the second surface 22 of the dielectric element 20 of therespective microelectronic package 10 a or 10 b with the same function,although the particular dimensions of the length, width, and height ofeach microelectronic package 10 can be different than that of the othermicroelectronic packages.

In a particular example (not shown), a spatial distribution of the firstterminals 25 a along the second surface 22 of the dielectric element 20of at least one of the first and second microelectronic packages 10 canbe different from a spatial distribution of the corresponding panelcontacts 65 to which they are electrically connected, such that at leastone of the first terminals 25 a does not directly overlie thecorresponding panel contact 65 to which it is electrically connected.

As shown in FIG. 5E, the circuit panel 60 of the microelectronicassembly 381 can include one or more routing layers 66, e.g., a layer ofelectrically conductive traces thereon, for routing of all of thecommand signals, address signals, bank address signals, and clocksignals. As discussed in the foregoing, and as particularly shown inFIG. 5E, vias 67 extending through the circuit panel 60 can be coupledto the panel contacts 65 by conductive structure 68 (e.g., traces) ofthe routing layer 66. In a particular example, the total combined lengthof the conductive elements (e.g., the vias 67 and the conductivestructure 68) connecting a pair of electrically coupled first and secondpanel contacts 65 a and 65 b exposed at the respective first and secondsurfaces 61 and 62 of the circuit panel 60 can become quite short sincethe terminals of the packages to which they are to be connected canessentially overlie one another.

In the microelectronic assembly 381, each first terminal 25 a of thefirst microelectronic package 10 a can be electrically coupled throughthe circuit panel 60 to a corresponding first terminal of the secondmicroelectronic package 10 b having the same function, with a relativelyshort stub length. As used herein, “stub length” means the total lengthof the shortest electrical connection between a first terminal 25 a of amicroelectronic package 10 at a first surface of the circuit panel and acorresponding terminal of a microelectronic package at the secondopposed surface of the circuit panel. Straight through connections herecan help greatly reduce stub lengths of data terminals that areconnected together of the first and second (top and bottom) packages 10a, 10 b. FIG. 5F illustrates a variation of the embodiment describedabove relative to FIG. 5E, in which vias 67′ extending through thecircuit panel 60′ are arranged in a common vertical plane with the firstterminals 25 a of each of the first and second microelectronic packages10 a, 10 b. Although the vias 67′ and the first terminals 25 a are in acommon vertical plane, corresponding first terminals 25 a in each of thefirst and second microelectronic packages 10 a and 10 b can behorizontally offset from one another, so that horizontally andvertically extending conductive structure (e.g., traces and metalizedvias) of the circuit panel can electrically connect the correspondingfirst terminals. Similar to FIG. 5E, a schematic is shown of theelectrical connections between corresponding ones of the panel contacts65 in FIG. 5F.

As further seen in FIG. 5H, first terminals 25 a and second terminals 25b, 125 b of the first microelectronic package 10 a can be mounted tocircuit panel 60 opposite the first terminals 25 a and second terminals25 b, 125 b of the second microelectronic package 10 b such that secondterminals of the first and second microelectronic packages 10 a, 10 bwhich are configured to carry address information of the same numericalweight lie in a common vertical plane. Such arrangement can allow atleast some of the electrical connections through the circuit panel 60′that carry any type of signal such as data signals, address information,command signals, bank address signals, and clock signals to extend indirections essentially straight through the circuit panel 760 between 25b, 125 b of the first and second microelectronic packages 10 a, 10 b. Asa result, the electrical length of such connections can approximatelythe same as a thickness of the circuit panel.

As illustrated in FIG. 5G, the command-address bus signals can be routedin at least one direction D1 between connection sites on a circuit panelsuch as the circuit panel 60 at which a plurality of microelectronicpackages 10 a, 10 b are connected, such that signals of thecommand-address bus 137 reach each pair of packages 10 a and 10 b atrespective connection sites I, II or III at slightly different times. Asseen in FIG. 5G, the at least one direction D1 can be transverse ororthogonal to a direction D2 in which at least one column 36 of aplurality of contacts 35 on at least one microelectronic element 30extends. In such a way, the signal conductors of the command-address bus137 on (i.e., on or within) the circuit panel 60 can in some cases bespaced apart from one another in the direction D2 that is parallel tothe at least one column 36 of contacts 35 on a microelectronic element30 within a package 10 a or 10 b connected to, or to be connected to thecircuit panel 60.

Such a configuration, particularly when terminals of eachmicroelectronic package 10 a, 10 b are arranged in one or more columnsextending in such direction D2, may help simplify the routing of signalconductors of one or more routing layers on the circuit panel 60 used toroute command-address bus signals. For example, it may be possible tosimplify routing of the command-address bus signals on a circuit panelwhen relatively few of the second terminals are disposed at the samevertical layout position on each package. Thus, in the example shown inFIG. 5A, only two second terminals in each group of second terminals 25b, 125 b may be disposed at the same vertical layout position on eachpackage, such as, for example, the second terminals in each group whichare configured to carry address signals A3 and A1.

In an exemplary embodiment, a microelectronic assembly 381 can have amicroelectronic element 130 which includes a semiconductor chipconfigured predominantly to perform a logic function, such as a solidstate drive controller, and one or more of the microelectronic elements30 in the microelectronic packages 10 a and 10 b can each include memorystorage elements such as nonvolatile flash memory. The microelectronicelement 130 can include a special purpose processor that is configuredto relieve a central processing unit of a system such as the system 1100(FIG. 11) from supervision of transfers of data to and from the memorystorage elements included in the microelectronic elements 30. Such amicroelectronic element 130 including a solid state drive controller canprovide direct memory access to and from a data bus on a motherboard(e.g., the circuit panel 1102 shown in FIG. 11) of a system such as thesystem 1100. In a particular embodiment, the microelectronic element 130can be configured to perform a buffering function, e.g., themicroelectronic element 130 can be configured to regenerate data signalsor the above-noted command-address bus signals for transfer to each ofthe microelectronic packages 10 a and 10 b. Such a microelectronicelement 130 can be configured to help provide impedance isolation foreach of the microelectronic elements 30 with respect to componentsexternal to the microelectronic assembly 381.

In such an embodiment of the microelectronic assembly 381 having amicroelectronic element 130 that includes a controller function and/or abuffering function, the command-address bus signals can be routedbetween the microelectronic element 130 and each pair of packages 10 aand 10 b at respective connection sites I, II or III. In the particularexample shown in FIG. 5H, a portion of the command-address bus 137 thatextends past the connection sites I, II or III can extend in thedirection D2 or in another direction transverse to the direction D1 toreach contacts of the microelectronic element 130. In one embodiment,the command-address bus 137 can extend in the direction D1 to reachcontacts of the microelectronic element 130.

FIG. 8 illustrates a variation of the embodiment described aboverelative to FIG. 7 in which the microelectronic package 410 includesfour microelectronic elements 430 a, 430 b, 432 a and 432 b. Suchpackage 410 is similar to that of FIG. 7 in that microelectronicelements 430 a, 430 b are arranged in the package 410 in like manner tothe microelectronic elements shown in FIG. 7, and the first terminals423 can be electrically coupled to contacts of the microelectronicelements 430 a, 430 b. Similarly, microelectronic elements 432 a, 432 bare arranged in package in like manner to the microelectronic elementsshown in FIG. 7, and the first terminals 433 can be electrically coupledto contacts of the microelectronic elements 432 a, 432 b. Contacts ofthe microelectronic elements 430 a, 430 b are aligned with apertures 426and electrical connections to the contacts can be made using a toolinserted into the aperture to form a bond between leads, e.g., integralleads or wire leads, and such contacts. Groups 443, 453 of secondterminals disposed adjacent to edges 440, 442 of the package,respectively are configured for carrying address signals and can bearranged in like manner as the groups 25 b, 125 b of second terminalspreviously described above relative to FIG. 5A. Contacts of themicroelectronic elements 432 a, 432 b are aligned with apertures 427 andelectrical connections to the contacts can be made using a tool insertedinto the aperture to form a bond between leads, e.g., integral leads orwire leads, and such contacts.

FIG. 9 illustrates a microelectronic package 510 according to anothervariation of the embodiment seen in FIG. 5A in which nearest edges 506,508 of the microelectronic elements 530 a, 530 b can be spaced apartfrom one another and such that the front faces (not shown) of themicroelectronic elements may lie in a common place adjacent to the firstsurface of the substrate (not shown). In this case, the first terminalsmay include two groups 525, 527 of first terminals in which the signalassignment of each first terminal assigned to carry a data signal ingroup 225 on a first side of a theoretical axis 532 has mirror-imagesymmetry with the signal assignment of a corresponding first terminal ona second side of the axis opposite thereto. In a variation of theembodiment seen in FIG. 9, the first terminals may include only onegroup of the first terminals rather than the two groups 525, 527 whichhave mirror-image symmetry as described herein. In a further variation,the signal assignments of the two groups 525, 527 of first terminalshave modulo-X symmetry about axis 532 similar to the modulo-X symmetryof first terminals described above relative to FIG. 6.

Referring to FIG. 10, in a variation of the embodiment of FIG. 9, themicroelectronic package 610 has 32 first terminals 625 which can be inform of DQ terminals numbered DQ0 through DQ31, and which can bearranged to support one or two 32-bit ranks of memory access, forexample. As seen in FIG. 10, the first terminals 625 can be arranged atpositions at a first surface of the dielectric element (FIG. 5B) in twogroups 626 and 627, with each DQ terminal in a first group 626 of thefirst terminals on a first side of a theoretical axis 632 havingmodulo-8 symmetry with each DQ terminal in a second group 627 of thefirst terminals on a second side of the axis 632 opposite from the firstside.

The microelectronic packages and microelectronic assemblies describedabove with reference to FIGS. 5A through 10 can be utilized inconstruction of diverse electronic systems, such as the system 1100shown in FIG. 11. For example, the system 1100 in accordance with afurther embodiment of the invention includes a plurality of modules orcomponents 1106 such as the microelectronic packages and/ormicroelectronic assemblies as described above in conjunction with otherelectronic components 1108 and 1110.

In the exemplary system 1100 shown, the system can include a circuitpanel, motherboard, or riser panel 1102 such as a flexible printedcircuit board, and the circuit panel can include numerous conductors1104, of which only one is depicted in FIG. 11, interconnecting themodules or components 1106 with one another. Such a circuit panel 1102can transport signals to and from each of the microelectronic packagesand/or microelectronic assemblies included in the system 1100. However,this is merely exemplary; any suitable structure for making electricalconnections between the modules or components 1106 can be used.

In a particular embodiment, the system 1100 can also include a processorsuch as the semiconductor chip 1108, such that each module or component1106 can be configured to transfer a number N of data bits in parallelin a clock cycle, and the processor can be configured to transfer anumber M of data bits in parallel in a clock cycle, M being greater thanor equal to N. In the example depicted in FIG. 11, component 1108 can bea semiconductor chip and component 1110 is a display screen, but anyother components can be used in the system 1100. Of course, althoughonly two additional components 1108 and 1110 are depicted in FIG. 11 forclarity of illustration, the system 1100 can include any number of suchcomponents.

In one example, the system 1100 can include a processor chip 1108 thatis configured to transfer thirty-two data bits in parallel in a clockcycle, and the system can also include four modules 1106 such as themicroelectronic package 10 described with reference to FIG. 5A, eachmodule 1106 configured to transfer eight data bits in parallel in aclock cycle (i.e., each module 1106 can include first and secondmicroelectronic elements, each of the two microelectronic elements beingconfigured to transfer four data bits in parallel in a clock cycle).

In another example, the system 1100 can include a processor chip 1108that is configured to transfer sixty-four data bits in parallel in aclock cycle, and the system can also include four modules 1106 such asthe microelectronic package 910 described with reference to FIG. 9A,each module 1106 configured to transfer sixteen data bits in parallel ina clock cycle (i.e., each module 1106 can include four microelectronicelements, each of the four microelectronic elements being configured totransfer four data bits in parallel in a clock cycle).

Modules or components 1106 and components 1108 and 1110 can be mountedin a common housing 1101, schematically depicted in broken lines, andcan be electrically interconnected with one another as necessary to formthe desired circuit. The housing 1101 is depicted as a portable housingof the type usable, for example, in a cellular telephone or personaldigital assistant, and screen 1110 can be exposed at the surface of thehousing. In embodiments where a structure 1106 includes alight-sensitive element such as an imaging chip, a lens 1111 or otheroptical device also can be provided for routing light to the structure.Again, the simplified system shown in FIG. 11 is merely exemplary; othersystems, including systems commonly regarded as fixed structures, suchas desktop computers, routers and the like can be made using thestructures discussed above.

Although the invention herein has been described with reference toparticular embodiments, it is to be understood that these embodimentsare merely illustrative of the principles and applications of thepresent invention. It is therefore to be understood that numerousmodifications may be made to the illustrative embodiments and that otherarrangements may be devised without departing from the spirit and scopeof the present invention as defined by the appended claims.

It will be appreciated that the various dependent claims and thefeatures set forth therein can be combined in different ways thanpresented in the initial claims. It will also be appreciated that thefeatures described in connection with individual embodiments may beshared with others of the described embodiments.

In any of the embodiments described herein, one or more of themicroelectronic elements 30 can be implemented in one or more of thefollowing technologies: DRAM, NAND flash memory, RRAM (“resistive RAM”or “resistive random access memory”), phase-change memory (“PCM”),magnetoresistive random access memory, e.g. such as may embodimenttunnel junction devices, static random access memory (“SRAM”),spin-torque RAM, or content-addressable memory, among others.

What is claimed is:
 1. A microelectronic package, comprising: adielectric element having first and second oppositely facing surfaces,and having first and second spaced apart apertures each extendingbetween the first and second surfaces; a first microelectronic elementhaving a front face facing said first surface, a rear face facing awayfrom said first surface and an edge extending between said front andrear faces, said first microelectronic element having contacts exposedat said front face; and a second microelectronic element having a frontface partially overlying said rear face of said first microelectronicelement and facing said first surface, said second microelectronicelement having contacts disposed in a central region of its front face,said contacts disposed beyond said edge of said first microelectronicelement, said dielectric element having terminals at said secondsurface, said contacts of said first microelectronic element overlyingsaid first aperture and electrically coupled with said terminals, andsaid contacts of said second microelectronic element overlying saidsecond aperture and electrically coupled with said terminals, saidterminals including a plurality of first terminals between said firstand second apertures configured to carry all data signals for read andwrite access to random access addressable memory locations of memorystorage arrays within the first and second microelectronic elements.